Image processing, analysis, and machine vision
By: Sonka, Milan.
Contributor(s): Boyle, Roger | Hlavac, Vaclav.
Publisher: Andover Cengage Learning 2008Edition: 3rd.Description: xxv,829 p. | Binding - Paperback |.ISBN: 978-81-315-1883-0.Subject(s): EXTC Engineering
DDC classification: 621.367 Summary: This robust text provides deep and wide coverage of the full range of topics encountered in the field of image processing and machine vision. As a result, it can serve undergraduates, graduates, researchers and professionals looking for a readable reference. The book's encyclopedic coverage of topics is wide and it can be used in more than one course (both image processing and machine vision classes). In addition, while advanced mathematics is not needed to understand basic concepts (making this a good choice for undergraduates), rigorous mathematical coverage is included for more advanced readers. It is also distinguished by its easy to understand algorithm descriptions of difficult concepts and a wealth of carefully selected problems and examples.
| Item type | Current location | Collection | Call number | Status | Date due | Barcode | Item holds |
|---|---|---|---|---|---|---|---|
Text Books
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School of Engineering & Technology Reference Section | Reference | 621.367 SON/HLA (Browse shelf) | Not For Loan | E10328 |
This robust text provides deep and wide coverage of the full range of topics encountered in the field of image processing and machine vision. As a result, it can serve undergraduates, graduates, researchers and professionals looking for a readable reference. The book's encyclopedic coverage of topics is wide and it can be used in more than one course (both image processing and machine vision classes). In addition, while advanced mathematics is not needed to understand basic concepts (making this a good choice for undergraduates), rigorous mathematical coverage is included for more advanced readers. It is also distinguished by its easy to understand algorithm descriptions of difficult concepts and a wealth of carefully selected problems and examples.
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